22 results
Sample Preparation of Fully Packaged Quantum Well Laser Diodes for STEM-EBIC Analysis
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- Microscopy and Microanalysis / Volume 10 / Issue S02 / August 2004
- Published online by Cambridge University Press:
- 01 August 2004, pp. 146-147
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- August 2004
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Development of a STEM-EBIC/CL System for Structural, Compositional, Electrical, and Optical Characterization of Quantum Well Devices
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- Microscopy and Microanalysis / Volume 10 / Issue S02 / August 2004
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- 01 August 2004, pp. 194-195
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- August 2004
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Characterization of Self-Assembled Nanofibers
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- Microscopy and Microanalysis / Volume 9 / Issue S02 / August 2003
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- 24 July 2003, pp. 1226-1227
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- August 2003
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Development of a STEM-EBIC/CL System
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- Microscopy and Microanalysis / Volume 9 / Issue S02 / August 2003
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- 22 July 2003, pp. 474-475
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- August 2003
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Measurements of GaN-Based Heterostructures with Electron Beam Induced Current
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- Microscopy and Microanalysis / Volume 8 / Issue S02 / August 2002
- Published online by Cambridge University Press:
- 01 August 2002, pp. 1208-1209
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- August 2002
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Investigation of Self-assembled Nanofibers using Atomic Force Microscopy
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- Microscopy and Microanalysis / Volume 8 / Issue S02 / August 2002
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- 01 August 2002, pp. 770-771
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- August 2002
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Focused Ion Beam: Much More Than a Sample Preparation Tool
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- Microscopy and Microanalysis / Volume 8 / Issue S02 / August 2002
- Published online by Cambridge University Press:
- 01 August 2002, pp. 54-55
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- August 2002
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EBIC Measurements of Minority Carrier Diffusion Length in a Gan-based Light Emitting Diode
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- Microscopy and Microanalysis / Volume 7 / Issue S2 / August 2001
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- 02 July 2020, pp. 566-567
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- August 2001
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Chemically Assisted Focused ION Beam Micromachining: Overview, Recent Developments and Current Needs
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- Microscopy and Microanalysis / Volume 7 / Issue S2 / August 2001
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- 02 July 2020, pp. 928-929
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- August 2001
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Room Temperature Dewetting of Polymer Thin Films Investigated by AFM and Low Voltage SEM
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- Microscopy and Microanalysis / Volume 6 / Issue S2 / August 2000
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- 02 July 2020, pp. 710-711
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- August 2000
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Increasing the Lateral Resolution of Scanning Spreading Resistance Microscopy
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- MRS Online Proceedings Library Archive / Volume 610 / 2000
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- 17 March 2011, B2.4
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- 2000
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Self-Assembled Monolayers: Assembling, Disassembling and Reassembling Studies Using Afm
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- Microscopy and Microanalysis / Volume 5 / Issue S2 / August 1999
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- 02 July 2020, pp. 964-965
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- August 1999
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Imaging Self-Assembled Monolayers: a Comparative Study Between AFM and Field-Emission SEM
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- Microscopy and Microanalysis / Volume 5 / Issue S2 / August 1999
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- 02 July 2020, pp. 324-325
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- August 1999
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The Nc State Analytical Instrumentation Facility
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- Microscopy and Microanalysis / Volume 5 / Issue S2 / August 1999
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- 02 July 2020, pp. 10-11
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- August 1999
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Using AFM Phase Lag Data to Indentefy Microconstituents With Varying Values of Elastic Modulus
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- Microscopy and Microanalysis / Volume 4 / Issue S2 / July 1998
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- 02 July 2020, pp. 334-335
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- July 1998
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Scanning Kelvin Force and Capacitance Microscopy Applications
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- Microscopy and Microanalysis / Volume 4 / Issue S2 / July 1998
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- 02 July 2020, pp. 330-331
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- July 1998
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Using a Moderate Vacuum, Hot/Cryo-Stage Equipped AFM for In-Situ Observation of α-Phase Growth In 60SN40PB Hypoeutectic Solder
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- Microscopy and Microanalysis / Volume 4 / Issue S2 / July 1998
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- 02 July 2020, pp. 316-317
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- July 1998
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Diamond Indenter Shaping Using Focused Ion Beam
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- Microscopy and Microanalysis / Volume 4 / Issue S2 / July 1998
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- 02 July 2020, pp. 320-321
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- July 1998
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Scanning Probe Microscopy: Internet Resource Development and Integration into Undergraduate Curriculum
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- Microscopy and Microanalysis / Volume 3 / Issue S2 / August 1997
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- 02 July 2020, pp. 1279-1280
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- August 1997
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Quantitative Analysis and Interpretation of Atomic Force Microscopy (AFM) Phase Imaging
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- Microscopy and Microanalysis / Volume 3 / Issue S2 / August 1997
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- 02 July 2020, pp. 1271-1272
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- August 1997
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